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Title :X線イメージングによる電子機器の非破壊検査に関する研究
Title alternative :Studies on non-destructive inspection for electrical products by means of X-ray imaging
Authors :寺本, 篤司
Issue Date :25-Mar-2008
Type Local :博士論文
URI :http://hdl.handle.net/20.500.12099/23509
Appears in Collections:Engineering B